IC's extreme complicated integration and multistack technology makes failure mode diversify. On the other hands, The demand for Failure Analysis method is more shorten time and definitely, also require low risk and low cost.
IC Decapsulation is the preparation working to remove the resistance material where locates the failure needed to confirm and investigate. NSC has been developed suitable system for various IC's opening requirements and then listed test equipments and contract decap service since NSC founded in 1987. Today, these equipments have been used in worldwide customer and NSC has credibility of decap solution through the business of EDlab.
NSC is continuing to try for supporting the present scene of failure analysis.